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Multifunctional Nanomaterials Characterization Exploiting EllipsoMetry and Polarimetry
Jul 29, 2010 at 06:10 PM
 
 
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Questionnaire

Help us define current and future needs. The information gathered will also assist us in determining the most useful ellipsometer(s) for Nano applications.

Click here to participate >>

3rd NanoCharm Workshop on Non-Destructive Real Time Process Control

The 3rd NanoCharm Workshop on Non-Destructive Real Time Process Control will take place between the 13 - 15 October, 2010 at the Technical University of Berlin in Germany.

Full details to follow.

NanoCharM Newsletter 5

The fifth issue of the NanoCharM Newsletter: the newsletter for scientists, companies and organizations involved in the field of nanomaterials synthesis, characterization and production.

This issue provides an extensive presentation of Ellipsometer leading technologies and suppliers, including:

Company profiles: 6 in-depth profiles of Ellipsometry leaders

Technology and application profiles: detailed assessments explaining key ellipsometry applications in nanotechnologies.

Those profiles show how ellipsometry is going beyond a simple technique and moving forward multidiagnostic platforms merging corroborating techniques.

Explore the chances!

Click here to view the pdf >>

Proceedings Available: API'09 - First NanoCharM Workshop on Advanced Polarimetric Instrumentation

The proceedings from API'09, the First NanoCharM Workshop on Advanced Polarimetric Instrumentation, are now available to view online.

 The presentations cover a host of subjects, including:

  • Imaging Polarimetry
  • Scatterometry and metrology of small particles
  • Measurement of circular dichroism and birefringence
  • Mueller matrix algebra and data analysis
  • Radar and astronomical polarimetry
  • New frontiers in polarimetry
Read more...
Announcement: Proceedings of the 3rd NanoCharM Winterschool

The "Proceedings of the 3rd NanoCharM Winterschool" have now been published
(ISBN: 978-3-901578-21-2) and are 
available to view & download in the library.

 View & Download >>

Announcement: 3rd NanoCharM Workshop on Non-Destructive, Real-Time, Process Control

The 3rd NanoCharM Workshop on Non-Destructive, Real-Time, Process Control will take place between the 13th - 15th October 2010.

Date: 13th - 15th October, 2010
Venue: Technische Universitat Berlin

 More information and registration link to follow.

3rd NanoCharM European School on Ellipsometry Summary

 A group photo of all the attendees at this year's winter school

A summary of the 3rd NanoCharM European Winter School on Ellipsometry has now been added to the library.

Click here to view the summary >>

Read more...
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