Welcome to the fourth issue of the NanoCharM Newsletter: the newsletter for scientists, companies and organizations involved in the field of nanomaterials synthesis, characterization and production.

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Inside this issue:

• The Nanomaterial characterization bottleneck
• Follow the light: Ellipsometry and polarimetry
• Characterization of solar cells by Spec-troscopic Ellipsometry
• What can Raman Spectroscopy and Spectroscopic Ellipsometry bring to characterization of material surfaces and thin films?
• Gallium nanoparticles by spectroscopic ellipsometry and Raman spectroscopy
• Dissemination Activities
• NIM-NIL: Large Area Fabrication of 3D Negative Refractive Index Materials by Nanoimprint Lithography
• Group Profile: Ecole Polytechnique-CNRS, Palaiseau France
• Forthcoming Events: The 5th International Conference on Spectroscopic Ellipsometry
• The 3rd Nano-CharM winter School

Special points of interest:

• To reap the benefits of nanotechnology, improvements in characterization are
  needed to increase throughput as creativity outpaces our ability to confirm results. The
  considerations of research, commerce, and regulation are part of a larger feedback loop that illustrates a mutual need for rapid, easy, and standardized characterization of a large property matrix. Now, we have an opportunity and a need to strike a new balance that drives higher quality research, simplifies commercial exploitation, and allows reasoned regulatory approaches