| ICSE-V - 23-28 May 2010: Albany, NY, USA |
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The 5th International Conference on Spectroscopic Ellipsometry (ICSE-V) covers new advances and developments in science, technology, and applications of spectroscopic ellipsometry including the related optical analysis techniques that commonly exploit polarization. ICSE-V will expand on topics covered at the four previous Conferences held in Paris, France (ICSE-1, 1993), Charleston SC, USA (ICSE-2, 1997), Vienna, Austria (ICSE-3, 2003), and Stockholm, Sweden (ICSE-4, 2007) by adding new topics such as non-linear optical measurements and further emphasizing related polarization techniques. 5th International Conference on Spectroscopic Ellipsometry - 23-28 May 2010: Albany, NY, USA ICSE-V continues the tradition of previous Conferences by serving as the premier forum for the international community of scientists and engineers working in the field of ellipsometry and related measurement techniques. ICSE-V will be held at the College of Nanoscale Science and Engineering (CNSE) in Albany, New York. A global education, research, development, and technology deployment resource dedicated to preparing the next generation of leading scientists and researchers in nanotechnology, CNSE is home to the $5 billion Albany NanoTech Complex, the most advanced research enterprise in the academic world. The city of Albany is the historic capital of the state of New York. Located in New York’s Tech Valley region, Albany and the surrounding area is known for everything from the unique downtowns of Albany, Schenectady, and Troy, to first-rate horse racing in Saratoga, and now, to a world-class cluster of nanotechnology companies, organizations, and institutions. Topical areas from this outline of recent current interest include:
A day of tutorials on-site on Sunday, 23 May 2010, is being planned. Tutorial Instructors and Tentative Titles
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