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Multifunctional Nanomaterials Characterization Exploiting EllipsoMetry and Polarimetry
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Sep 09, 2010 at 02:41 AM
  
 
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Help us define current and future needs. The information gathered will also assist us in determining the most useful ellipsometer(s) for Nano applications.

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'Proceedings of the 3rd NanoCharM Winterschool'
(ISBN: 978-3-901578-21-2)

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Summary
Programme
Abstracts
Complete Proceedings : Login/Register to read more...
00 - Cover : Login/Register to read more...
01 - M. Losurdo - Welcome : Login/Register to read more...
01 - Advanced reading : Login/Register to read more...
02 - E. Irene - Fundamentals of Ellipsometry : Login/Register to read more...
03 - D. Aspnes - Viewgraphs used in 1stdielectric-function lecture : Login/Register to read more...
04 - K. Hingerl - Representation of Polarization : Login/Register to read more...
05 - M. Schubert - Terahertz to Infrared Ellipsometry and the Optical Hall effect : Login/Register to read more...
06 - D. Aspnes - Viewgraphs used in the 2nd dielectric-function lecture : Login/Register to read more...
07 - K. Hingerl - Effective Medium Theory : Login/Register to read more...
08 - E. Irene - Real Time and In-Situ Ellipsometry : Login/Register to read more...
09 - J. Humlicek - Optical response at nanoscale : Login/Register to read more...
09 - Panel Discussion : Login/Register to read more...
09 - C. Rockstuhl - Are effective material parameters feasible? : Login/Register to read more...
09 - E. Schubert - Glancing Angle Deposition : Login/Register to read more...
10 - D. Aspnes - Optical Properties Of Solids (Semiconductors) : Login/Register to read more...
11 - J. Humlicek - Propagation of light in layered materials : Login/Register to read more...
12 - M. Cardona - Dependence of Optical Spectra on Temperature and Isotopic Mass : Login/Register to read more...
13 - R. Gajic - Optical Properties of Metallic Nanostructures : Login/Register to read more...
14 - K. Hingerl - Anisotropic dielectric functions & Generalized Ellipsometry : Login/Register to read more...
15 - N. Esser - Reflection Anisotropy Spectroscopy at Semiconductor Surfaces and Nanostructures : Login/Register to read more...
16 - L. Sun - Application of RAS to Molecular Thin Films on Metal Surfaces : Login/Register to read more...
17 - J. Krenn - Introduction to Plasmonics : Login/Register to read more...
18 - C. Rockstuhl - Introduction to Optical Metamaterials : Login/Register to read more...
19 - E. Garcia - Optical Metrology Of Sub-Micrometer Gratings : Login/Register to read more...
20 - M. Bergmair - Experimental studies and RCWA simulations : Login/Register to read more...
20 - P.Zeppenfeld - Ellipsometry of Gratings : Login/Register to read more...
21 - F. Keilmann - Review Book Chapter on s-SNOM : Login/Register to read more...
21 - F. Keilmann - Spectroscopy Near-Field Microscopy : Login/Register to read more...
22 - D. Cattelan - Industrial applications : market trends and perspectives : Login/Register to read more...
23 - P. Weightman - The Study of Biological Systems Using Optical Techniques : Login/Register to read more...
24 - J. McGilp - Second Harmonic Generation : Login/Register to read more...
25 - D. Aspnes - Non-Linear Optics Simplified: The Anisotropic Bond-Charge Model Of NLO : Login/Register to read more...
26 - W. Richter - From Fundamentals to Applications in Nanoscience and Nanotechnology : Login/Register to read more...
27 - R. Ossikovski - Instrumentation In Ellipsometry And Polarimetry : Login/Register to read more...
28 - F. Bechstedt - Calculation of optical spectra from first principles : Login/Register to read more...
29 - D. Zahn - Introduction to organic materials and small molecules / Raman Monitoring : Login/Register to read more...
30 - C. Cobet - VUV and FIR ellipsometry : Login/Register to read more...
31 - M. Losurdo - Ellipsometry for Photovoltaics : Login/Register to read more...
32 - B. Hiese - Polarization Sensitive Optical Coherence Tomography : Login/Register to read more...
33 - A. Bonanni - Nitrides and related compounds : Login/Register to read more...
 
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"Shining the light of ellipsometry to the nanoworld"
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