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ICSE-V - 23-28 May 2010: Albany, NY, USA |
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The 5th International Conference on Spectroscopic Ellipsometry (ICSE-V) covers new advances and developments in science, technology, and applications of spectroscopic ellipsometry including the related optical analysis techniques that commonly exploit polarization. ICSE-V will expand on topics covered at the four previous Conferences held in Paris, France (ICSE-1, 1993), Charleston SC, USA (ICSE-2, 1997), Vienna, Austria (ICSE-3, 2003), and Stockholm, Sweden (ICSE-4, 2007) by adding new topics such as non-linear optical measurements and further emphasizing related polarization techniques. |
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