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Multifunctional Nanomaterials Characterization Exploiting EllipsoMetry and Polarimetry
Mar 11, 2010 at 02:09 AM
 
 
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Questionnaire

Help us define current and future needs. The information gathered will also assist us in determining the most useful ellipsometer(s) for Nano applications.

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Announcement: 3rd NanoCharM Workshop on Non-Destructive, Real-Time, Process Control

The 3rd NanoCharM Workshop on Non-Destructive, Real-Time, Process Control will take place between the 13th - 15th October 2010.

Date: 13th - 15th October, 2010
Venue: Technische Universitat Berlin

 More information and registration link to follow.

3rd NanoCharM European School on Ellipsometry Proceedings

 A group photo of all the attendees at this year's winter school

A summary of the 3rd NanoCharM European Winter School on Ellipsometry has now been added to the library.

Click here to view the summary >>

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NanoCharM Newsletter Issue 4

Welcome to the fourth issue of the NanoCharM Newsletter: the newsletter for scientists, companies and organizations involved in the field of nanomaterials synthesis, characterization and production.

Click here to view the pdf >>

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Announcement: 3rd NanoCharM (Winter) School on Ellipsometry

3rd NanoCharM European School on Ellipsometry

3rd NanoCharM (Winter) School on Ellipsometry
Fundamentals and Applications in Nanoscience and Nanotechnology
27th February - 5th March 2010
Bad Hofgastein, Salzburg, Austria

School Objectives
The winter school is the 3rd school in the frame of the EU Project NanoCharM. The lectures are separated in basic and advanced levels. A special focus will be set on plasmons and negative refraction structures.

Download Abstract Booklet >>

Download Programme >>

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ICSE-V - 23-28 May 2010: Albany, NY, USA

The 5th International Conference on Spectroscopic Ellipsometry (ICSE-V) covers new advances and developments in science, technology, and applications of spectroscopic ellipsometry including the related optical analysis techniques that commonly exploit polarization. ICSE-V will expand on topics covered at the four previous Conferences held in Paris, France (ICSE-1, 1993), Charleston SC, USA (ICSE-2, 1997), Vienna, Austria (ICSE-3, 2003), and Stockholm, Sweden (ICSE-4, 2007) by adding new topics such as non-linear optical measurements and further emphasizing related polarization techniques.

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